Integrated circuits - Ultra large scale integration.
Overview
Works: | 5 works in 1 publications in 1 languages |
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Titles
Applications of finite element methods for reliability studies on ULSI interconnections
by:
(Electronic resources)
ULSI front-end technology :covering from the first semiconductor paper to CMOS FINFET technology /
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(Language materials, printed)
ULSI front-end technologycovering from the first semiconductor paper to CMOS FINFET technology /
by:
(Electronic resources)
Subjects