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Random access memory - Testing.
概要
作品:
3 作品在 1 項出版品 1 種語言
書目資訊
Testing and testable design of high-density random-access memories /
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(書目-語言資料,印刷品)
Advanced test methods for SRAMseffective solutions for dynamic fault detection in nanoscaled technologies /
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(書目-電子資源)
Multi-run memory tests for pattern sensitive faults
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(書目-電子資源)
主題
Computer storage devices
Electronics and Microelectronics, Instrumentation.
Computer-Aided Engineering (CAD, CAE) and Design.
Processor Architectures.
Random access memory
Circuits and Systems.
Engineering.
Semiconductor storage devices
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