Integrated circuits - Very large scale integration - Testing.

Overview

Works:	11 works in 5 publications in 5 languages

Titles

Digital circuit testing and testability / by: (Language materials, printed)

Iddq testing for CMOS VLSI / by: (Language materials, printed)

From contamination to defects, faults, and yield loss :simulation and applications / by: (Language materials, printed)

Genetic algorithms for VLSI design, layout & test automation / by: (Language materials, printed)

VLSI test principles and architectures :design for testability / by: (Language materials, printed)

System-on-chip test architecturesnanometer design for testability / by: (Electronic resources)

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits by: (Electronic resources)

VLSI test principles and architecturesdesign for testability / by: (Electronic resources)

Debug automation from pre-silicon to post-silicon by: (Electronic resources)

VLSI design and test for systems dependability by: (Electronic resources)

Subjects

VLSI.

COMPUTERS

Testen.